Keywords: Chemical Analysis;Maximum Pixel Software (5884305705).jpg X-ray data collected with a scanning electron microscope from a nickel-aluminum alloy Pure aluminum is represented by blue pure nickel by red and nickel-aluminum alloys by colors in between The green dot in the upper left shows a contaminant particle of chromium identified with the NIST software that occupied only one pixel of the microscope's scanning area The sample measures about 160 micrometers across Image credit D Bright D Newbury/NIST Disclaimer Any mention of commercial products within NIST web pages is for information only; it does not imply recommendation or endorsement by NIST Use of NIST Information These World Wide Web pages are provided as a public service by the National Institute of Standards and Technology NIST With the exception of material marked as copyrighted information presented on these pages is considered public information and may be distributed or copied Use of appropriate byline/photo/image credits is requested https //www flickr com/photos/usnistgov/5884305705/ Chemical Analysis;Maximum Pixel Software 2011-06-29 08 33 https //www flickr com/people/63059536 N06 National Institute of Standards and Technology PD-USGov National Institute of Standards and Technology https //flickr com/photos/63059536 N06/5884305705 2016-09-07 02 51 55 United States Government Work Uncategorized 2016 December 20 |