Keywords: AFMimageRoughGlass20x20.png Atomic force microscope topographical scan of a glass surface The micro and nano-scale features of the glass can be observed portraying the roughness of the material The image space is x y z 20um x 20um x 420nm The AFM used was the Veeco di CP-II scanned in contact mode Constructed at the Nanorobotics Laboratory at Carnegie Mellon University http //nanolab me cmu edu http //en wikipedia org/w/index php title File AFMimageRoughGlass20x20 png oldid 78162444 03 02 6 October 2005 Chych Glass Atomic force microscopy Carnegie Mellon University |